新型肖特基場發(fā)射掃描電鏡SU7000－可獲得樣品的各種信息，實現(xiàn)高通量分析－肖特基場發(fā)射掃描電鏡SU7000合規意識，它縮短了通過采集多種信號獲取樣品多種信息的時間密度增加，真正實現(xiàn)了高通…

新型肖特基場發(fā)射掃描電鏡SU7000
－可獲得樣品的各種信息，實現(xiàn)高通量分析－

肖特基場發(fā)射掃描電鏡SU7000創新內容，它縮短了通過采集多種信號獲取樣品多種信息的時間機遇與挑戰，真正實現(xiàn)了高通量的觀察與分析。

                                             SU7000外觀圖

 
    掃描電子顯微鏡（SEM）可通過檢測樣品激發(fā)出的二次電子善於監督、背散射電子集成技術、X射線等信號，獲得從微細結構到組成成分等各種信息更合理，因此被廣泛應用于納米技術適應能力、半導體、電子器件各方面、生物防控、材料等諸多領域。隨著SEM的應用范圍在不斷擴大適應性，對觀察時間的縮短增產、信號的迅速高效采集提出了更進一步的需求。
   SU7000采用全新設計的探測器方法，使得對二次電子信號行動力、背散射電子信號的檢測以及分離能力大大提升。以前我們要根據(jù)獲得的信號來調整樣品與透鏡之間的距離（工作距離／以下簡稱WD）切實把製度，以設置合適的觀察與分析條件保供，而SU7000通過新研發(fā)的樣品倉以及檢測器系統(tǒng)自行開發，可在不改變WD的條件下更高效地接收各種信號，縮短了樣品觀察和分析的時間責任，提高了測試效率應用情況。
    而且，SU7000還配置了可同時6通道顯示界面（前代機型只能同時顯示4通道）深入各系統，進一步升級SEM控制系統(tǒng)解決問題，大幅提高了信號獲取速度，由此實現(xiàn)了樣品的高通量觀察作用。
    它還標配超大樣品倉相互配合，增設了附件接口，可適用于各種樣品的觀察與分析著力增加。
日立*將在8月5日（星期日）～8月9日（星期四）在美國馬里蘭州舉辦的“Microscopy & Microanalysis”及9月5日（星期三）～9月7日（星期五）在幕張展示中心（千葉縣千葉市）舉辦的“JASIS 2018”上展示這款SU7000智能化，預計每年銷量有望達150臺。
    日立*科學系統(tǒng)事業(yè)部以2020年成為電子顯微鏡行業(yè)為中期戰(zhàn)略目標處理，今后仍將全力推動產(chǎn)品研發(fā)與市場推廣建設，努力為制造業(yè)作出更大的貢獻。作為*助力各行、前沿的事業(yè)創(chuàng)新型企業(yè)前來體驗，今后以成為提供*和解決方案的企業(yè)為目標，始終站在客戶的立場確定性，快速滿足客戶和市場需求更加廣闊。

【主要特點】
1．在相同WD的條件下，可同時實現(xiàn)二次電子講故事、背散射電子觀察與X射線分析
2．多可同時實現(xiàn)6通道檢測與顯示
3．在大像素10,240 x 7,680時非常完善，也可獲得圖像數(shù)據(jù)
4．同級別*設備中多的可配置18個附件接口
5．支持低300Pa的低真空模式（選配）
*空間分辨率在1 nm/1 kV以下

【主要規(guī)格】

Key Concept

1. Versatile Imaging Capability
   The SU7000 excels in fast acquisition of multiple signals to address expansive SEM needs, from imaging a wide field of view to visualizing sub-nanometer structures and everything in between.
    The incorporation of newly designed electron optics and detection systems allows for efficient simultaneous acquisition of multiple secondary electron and back-scattered electron signals.
2. Multi-Channel Imaging
   The number of the detectors mounted on the SEM is ever increasing, along with the need to display all collected information effectively.
    The SU7000 is capable of processing, displaying, and saving up to 6 signals simultaneously to maximize information acquisition.
3. Wide Variety of Observation Techniques
   The specimen chamber and the vacuum system are optimized for:
   ?Large specimen size
   ?Sample manipulation at various axes
   ?Variable pressure conditions
   ?Cryogenic conditions
   ?Heating and cooling in-situ observation
4. Microanalysis
   The electron gun is equipped with a Schottky emitter that provides up to 200 nA beam current to accommodate various microanalysis applications.
    The specimen chamber and port layout are designed to incorporate multiple analytical options including EDX, WDX, EBSD, cathodoluminescence, and more.
    The SU7000 with the combination of numerous analytical accessories unifies multi-discipline techniques in a single platform.

Imaging Performance

Enhanced Information Acquisition

Single-Scan Multi-Signal Imaging

Specimen: Organic-coated gold rods

Specimen courtesy of: Mr. Smart and Ms. Je Chemistry Dept.,
Vassar College

Simultaneous image acquisition for surface micro-structural information (UD), surface coating (MD), and overall topographic information (LD). Acceleration voltage: 1 kV

Intuitive Graphical User Interface

Enhanced Signal Display

• Customizable display modes.
• Single and Dual-monitor configurations.
• Simultaneous image display up to 4-ch (single) and 6-ch (dual).
• Chamber Scope and SEM MAP for optical stage navigation.

Highly Flexible Screen Layout

The software is capable of display 1, 2, or 4 signals including the chamber scope or SEM MAP on a single monitor.
Additionally, the operation panel can be customized to display submenus anywhere on the screen.

Dual Monitor

The first monitor can be used as a dedicated image display while the second monitor is utilized for operation.
Five detector images (UD, LD, UVD, MD, and PD-BSED) and SEM MAP of non-metallic inclusions in a steel specimen are displayed (left).
The screen s the operation panel menu and the thumbnail image window on one screen (right).
The dual-monitor configuration supports increased productivity with expanded w

Expandable Observation and Analysis

Large specimen chamber and large stage

The specimen chamber can accommodate a tall specimen of φ 200 mm or 80 mm in height and 18 accessory ports. The large stage travels 135 mm (X) x 100 mm (Y) and can accept up to 2 kg of specimen.^(*) Large specimen or variable type of sub-stages can be easily mounted on the front-opening large stage door.

external view of the specimen chamber featuring 18 accessories por

external view of the stage. XY movable range: 135×100 mm

(*)at 0° tilt

Camera Navigation^(*)

Left: Picture of the sample captured by the camera equipped inside the chamber.
Right: Camera image transferred to the SEM MAP screen for navigation.

The camera navigation feature correlates an optical image to the target observation area.
The camera installed in the specimen chamber captures the specimen image at the time of specimen introduction. The image is transferred to the SEM MAP screen for a graphically driven navigation interface.
Camera navigation supports a maximum of φ 100 mm specimen.

(*)

Camera navigation function is optional

Detection System Enabling Dynamic Observation

The SU7000 supports observation under various environmental conditions. A variety of detectors ^(*) such as UVD and MD are selectable in addition to the PD-BSED for observation under low-vacuum conditions. 

Detector Selection Under Low-Vacuum Conditions
Specimen: Fiber with metallic oxide
Left: MD (Backscattered electron) image
Right: UVD (SE image)
The oxide dispersion and fiber layering state are observed respectively.

 

Improved PD-BSED Response Speed

Left: Traditional PD-BSED response at the scan rate of 30 ms x 64 frames
Right: SU7000 PD-BSED image demonstrating improved response and image quality to expａnd in-situ observation capability

Specifications

Image Resolution	Resolution SE		0.8 nm@15 kV
			0.9 nm@1 kV
Magnification			20～2,000,000 x
Electron Optics	Emitter		ZrO/W Schottky Emitter
	Accelerating Voltage		0.1～30 kV (0.01 kV step)
	Probe Current		Max. 200 nA
Detectors	Standard Detectors		UD（Upper Detector)
			MD（Middle Detector）
			LD（Lower Detector)
	Optional Detectors		PD-BSED（Semiconductor type）
			UVD (Ultra Variable Pressure Detector）
Variable Pressure(VP) Mode (Option)	Pressure Range		5～300 Pa
	Available Detectors in VP mode		PD-BSED, UVD, UD, MD,LD
Specimen Stage	Stage Control		5-axis Motor Drive
	Movable Range	X	0～135 mm
		Y	0～100 mm
		Z	1.5～40 mm
		T	-5～70°
		R	360°
Specimen Chamber	Specimen Size		Max. φ200 mm, Max. 80mm Height
Monitor（Option)			23 inch LCD（1,920×1,080) , supports dual monitors operation
Image Display Mode	Large Screen Display Mode		1,280×960 pixels
	Single Image Display Mode		800×600 pixels
	Dual Image Display Mode		800×600 pixels、1,280×960 pixels with dual monitors
	Quad Image Display Mode		640×480 pixels
	Hex Image Display Mode w/dual monitors		640×480 pixels with dual monitors
Image Data Saving	Pixel Size		640×480全面革新、1,280×960作用、2,560×1,920、5,120×3,840建設項目、10,240×7,680
Optional Accessories	Energy Dispersive X-ray Spectrometer (EDX)
	Wavelength Dispersive X-ray Spectrometer (WDX)
	Electron Backscattered Diffraction Detector (EBSD)
	Cathodoluminescence System (CL)
	Cryogenic Transfer System
	Compatible with various types of sub-stages

Installation Diagram